新書推薦:
《
大学问·中国城市史研究系列 茶馆 天津工人 晚清中国城市的水与电 亦官亦商(套装共4册)
》
售價:NT$
1805.0
《
索恩丛书·信仰与权力:阿拉伯世界的裂变与重生
》
售價:NT$
658.0
《
哲学之旅(第8版):一种互动性探究(最新完整版,2025中国-东盟影响力图书)
》
售價:NT$
764.0
《
何以为帝:雍正继位新探(清史泰斗冯尔康,从继位疑案读懂中国封建皇权,看清人性与制度的极致博弈)
》
售價:NT$
347.0
《
元照英美法词典(简装学生版)
》
售價:NT$
505.0
《
防患于未“燃”:故宫历史上的火灾与消防(在故宫) 探秘故宫防火智慧 解码古建营造技艺
》
售價:NT$
403.0
《
从家族企业到商业世家:创业家族世代繁荣的路线图
》
售價:NT$
403.0
《
敦煌石窟乐舞图像研究
》
售價:NT$
857.0
內容簡介:
Characterization in Optica Materias provides information for understanding the properties and performance of optical materials under the influence of the various characterization techniques. Surface and interfacial properties are key to the optical response of a material, and their control and modification during materials processing is necessary to achieve desired behavior. Characterization of Optica Materias focuses on how surface morphology, microstructure, and chemical bonding influence the optical response of a material, and it illuminates methods used to characterize thin films, multilayer structures, and modified surfaces,
目錄 :
PrefacetotheReissueoftheMaterialsCharacterizationSeries
PrefacetoSeries
PrefacetotheReissueofCharacterizationofOpticalMaterials
Preface
Contributors
INTRODUCTION
PART1INFLUENCEOFSURFACEMORPHOLOGYAND
MICROSTRUCTUREONOPTICALRESPONSE
CHARACTERIZATIONOFSURFACEROUGHNESS
1.1Introduction
1.2WhatSurfaceRoughnessls
1.3HowSurfaceRoughnessAffctsOpticaIMeasurements
1.4HowSurfaceRoughnessandScatteringAreMeasured
1.5CharacterizationofSelectedSurfaces
1.6FutureDifections
CHARACTERIZATIONOFTHENEAR-SURFACEREGIONUSINGPOIARIZATION-SENSITIVEOPTICALTECHNIQUES
2.1Introduction
2.2Ellipsometry
ExperimentallmplementationsofEllipsometry29,Analysisof
EllipsometryData
2.3MicrostructuralDeterminationsfromEllipsometryData
TemperatureDependenceoftheOpticatPropertiesofSilicon34,
DeterminationoftheOpticalFunctionsofGlassesUsingSE35,
SpectroscopicEllipsometryStudiesofSi02Si37,Spectroscopic
EllipsometryforComplicatedFilmStrucrures38,Time-Resolved
Ellipsometry40,Single-WavelengthReal-TimeMonitoringofFilm
Growth41,Multiple-WavelengthReal-TimeMonitoringofFilm
Growth42,InfraredEllipsometryStudiesofFilmGrowth
THECOMPOSITION,STOICHIOMETRY,ANDRELATEDMICROSTRUCTUREOFOPTICALMATERIALS
3.1Introduction
3.2AspectsofRamanScattering
3.3III-VSemiconductorSystems
3.4GroupIVMaterials
3.5AmorphousandMicrocrystallineSemiconductors
ChalcogenideGlasses60,GroupIVMicrocrystallineSemiconductors
3.6Summary
DIAMONDASANOPTICALMATERIAL
4.1Introduction
4.2DepositionMethods
4.30pticalPropertiesofCVDDiamond
4.4DefectsinCVDDiamond
4.5PolishingCVDDiamond
4.6X-rayWindow
4.7Summary
PART2STABILITYANDMODIFICATIONOFFILMANDSURFACEOPTICALPROPERTIES
MULTIJAYEROPTICALCOATINGS
5.1Introduction
5.2Single-LayerOpticalCoatings
OpticaIConstants90,CompositionMeasurementTechniques
5.3MultilayerOpticalCoatings
CompositionaIAnalysis107,SurfaceAnalyticaITechniques108,
MicrostructuralAnalysisofMultilayerOpticalCoatings
5.4StabilityofMultilayerOpticalCoatings
5.5FutureCompositionaland
MicrostructuralAnalyticaITechniques
CHARACTERIZATIONANDCONTROLOFSTRESSINOPTICALFILMS
6.1Introduction
6.20riginsofStress
……